HALT / HASS Testing

The Nokia Global Product Compliance Laboratory (GPCL) offers Highly Accelerated Life Testing (HALT) / Highly Accelerated Stress Screening (HASS) at its Murray Hill facility.

HALT / HASS is a design verification tool for testing electronic and electromechanical devices. HALT / HASS testing employs extreme thermal rate changes and vibration stresses that quickly uncover design flaws and triggers latent defects that might otherwise be exhibited as field failures. Our HALT / HASS chambers perform aggressive step-stressing.

By using extreme rates of temperature change and repetitive shock vibration, a product’s design and operating limits can be determined providing useful design and verification information about your product. In addition, the HALT /HASS testing provides a benchmark for design changes to increase reliability.

Benefits of HALT / HASS Testing include:

  • Reducing product development costs
  • Reducing field failures and associated costs
  • Increasing product quality and reliability
  • Ensuring customer satisfaction
  • Reducing time to market

T-12 Chamber

HALT / HASS Chamber Specifications

Table Capacity Table Dimensions Temperature Range Temperature Change Rate Acceleration
600 lbs. 48”x48” -100ºC to +200ºC Up to 70ºC per minute Over 50 gms