HALT / HASS Testing
The Nokia Global Product Compliance Laboratory (GPCL) offers Highly Accelerated Life Testing (HALT) / Highly Accelerated Stress Screening (HASS) at its Murray Hill facility.
HALT / HASS is a design verification tool for testing electronic and electromechanical devices. HALT / HASS testing employs extreme thermal rate changes and vibration stresses that quickly uncover design flaws and triggers latent defects that might otherwise be exhibited as field failures. Our HALT / HASS chambers perform aggressive step-stressing.
By using extreme rates of temperature change and repetitive shock vibration, a product’s design and operating limits can be determined providing useful design and verification information about your product. In addition, the HALT /HASS testing provides a benchmark for design changes to increase reliability.
Benefits of HALT / HASS Testing include:
- Reducing product development costs
- Reducing field failures and associated costs
- Increasing product quality and reliability
- Ensuring customer satisfaction
- Reducing time to market
HALT / HASS Chamber Specifications
|Table Capacity||Table Dimensions||Temperature Range||Temperature Change Rate||Acceleration|
|600 lbs.||48”x48”||-100ºC to +200ºC||Up to 70ºC per minute||Over 50 gms|